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1 article(s) from Wojcieszak, Robert

Study of mesoporous CdS-quantum-dot-sensitized TiO₂ films by using X-ray photoelectron spectroscopy and AFM

Mohamed N. Ghazzal,
Robert Wojcieszak,
Gijo Raj and
Eric M. Gaigneaux

Beilstein J. Nanotechnol. 2014, 5, 68–76, doi:10.3762/bjnano.5.6

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Figure 1: (a) AFM image of the mesoporous TiO₂ film and (b) TEM image showing the ordered–desordered regions ...

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Figure 2: AFM images showing size evolution of CdS particles grown on mesoporous TiO₂ with different number o...

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Figure 3: TEM image of the for 15×CdS/TiO₂ sample.

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Figure 4: Absorption spectra of the CdS-sensitized titanium dioxide films after different numbers of depositi...

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Figure 5: XPS analysis. Spectra of Ti 2p, O 1s, C 1s, Cd 3d and S 2p, and core peaks for 15×CdS/TiO2 sample.

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Figure 6: (a) CdS particle size calculated by Davis model vs NIR (normalized intensity ratio calculated from ...

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Published 20 Jan 2014

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Study of mesoporous CdS-quantum-dot-sensitized TiO2 films by using X-ray photoelectron spectroscopy and AFM

Study of mesoporous CdS-quantum-dot-sensitized TiO₂ films by using X-ray photoelectron spectroscopy and AFM